- Scanning electron microscope acquisition boon to nano research May 2010 (excerpt): The electron microscope has electron beam lithography and other advanced processing and characterization capabilities, including Focused Ion Beam technology, putting Texas State's microscopy capabilities on par with those of other state universities such as the University of Texas, Texas A&M and Texas Tech.
Contact
- Nikoleta Theodoropoulou
- ntheo@txstate.edu
- Office: RFM 3215
- Phone: (512) 245-5584
- Fax: (512) 245-8233
